XF

Xinrui Fan

NC National Institute Of Metrology, China: 1 patents #31 of 98Top 35%
Overall (All Time): #2,544,990 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
12140425 Four-quadrant interferometry system based on an integrated array wave plate Xiaofei Diao 2024-11-12