XD

Xiaofei Diao

HT Harbin Institute Of Technology: 1 patents #120 of 455Top 30%
NC National Institute Of Metrology, China: 1 patents #31 of 98Top 35%
Overall (All Time): #1,786,831 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12140425 Four-quadrant interferometry system based on an integrated array wave plate Xinrui Fan 2024-11-12
9587927 High speed high resolution heterodyne interferometric method and system Jiubin Tan, Pengcheng Hu 2017-03-07