Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841450 | Static electricity distribution measuring apparatus and static electricity distribution measuring method | Kazuya Kikunaga | 2017-12-12 |
| 9019498 | Method for inspecting defects, inspected wafer or semiconductor device manufactured using the same, method for quality control of wafers or semiconductor devices and defect inspecting apparatus | Kazufumi Sakai, Shinsuke Yamaguchi | 2015-04-28 |
| 8599379 | Method for inspecting defects and defect inspecting apparatus | Kazufumi Sakai | 2013-12-03 |
| 8076896 | Inverter controller and method for operating the same | Yoichi Yamamoto, Masaki Nakai | 2011-12-13 |
| 7423395 | Sensorless vector control method for alternating-current motor and control apparatus therefor | Hideaki Iura, Yuichi Terazono, Yoichi Yamamoto, Satoshi Sueshima, Katsushi Terazono +1 more | 2008-09-09 |
| 7258817 | Mechanoluminescence material and process for producing the same | Morito Akiyama, Chao Xu | 2007-08-21 |
| 7060371 | Mechanoluminescence material, producing method thereof, and usage thereof | Morito Akiyama, Chao Xu | 2006-06-13 |
| 6628375 | Method of and a system for measuring a stress or a stress distribution, using a stress luminescent material | Chao Xu, Morito Akiyama, Tadahiko Watanabe | 2003-09-30 |
| 6608427 | High-sensitivity flexible ceramic sensor | Morito Akiyama, Naohiro Ueno, Kiichi Ikeda, Hiroshi Tateyama | 2003-08-19 |
| 6280655 | High-luminosity stress-luminescent material | Chaonan Xu, Tadahiko Watanabe, Morito Akiyama | 2001-08-28 |
| 6240786 | Two-layer structure composite material for detecting cracks | Morito Akiyama, Tadahiko Watanabe | 2001-06-05 |
| 6159394 | Stress emission material and its manufacturing method | Morito Akiyama, Chaonan Xu, Tadahiko Watanabe | 2000-12-12 |