Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9019498 | Method for inspecting defects, inspected wafer or semiconductor device manufactured using the same, method for quality control of wafers or semiconductor devices and defect inspecting apparatus | Kazuhiro Nonaka, Shinsuke Yamaguchi | 2015-04-28 |
| 8599379 | Method for inspecting defects and defect inspecting apparatus | Kazuhiro Nonaka | 2013-12-03 |