Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315877 | Solid electrolyte and magnesium secondary battery using same | Takuji Tsujita, Yu Nishitani, Kensuke Nakura, Tohru Tsuruoka, Jin-Lian Su | 2025-05-27 |
| 9627499 | Electrical conduction element, electronic device, and method for operating electrical conduction element | Takashi Tsuchiya, Masakazu Aono | 2017-04-18 |
| 8896033 | Electrochemical transistor | Tsuyoshi Hasegawa, Masakazu Aono, Tohru Tsuruoka, Yaomi Itoh | 2014-11-25 |
| 8320154 | Switching element and application of the same | Tsuyoshi Hasegawa, Masakazu Aono, Fumiko Yano, Toru Tsuruoka, Tomoko Ebihara +3 more | 2012-11-27 |
| 8223427 | Method of fixing polarization-reversed region formed in ferroelectric single crystal | Xiaoyan Liu, Shunji Takekawa, Shunichi Hishita, Kenji Kitamura | 2012-07-17 |
| 7976717 | Method of forming polarization reversal area, apparatus thereof and device using it | Xijun LI, Kenji Kitamura, Hideki Hatano | 2011-07-12 |
| 7875883 | Electric device using solid electrolyte | Toshitsugu Sakamoto, Masakazu Aono, Tsuyoshi Hasegawa, Tomonobu Nakayama, Hisao Kawaura +1 more | 2011-01-25 |
| 7525410 | Point contact array, not circuit, and electronic circuit using the same | Masakazu Aono, Tsuyoshi Hasegawa, Tomonobu Nakayama | 2009-04-28 |
| 7473982 | Point contact array, not circuit, and electronic circuit comprising the same | Masakazu Aono, Tsuyoshi Hasegawa, Tomonobu Nakayama | 2009-01-06 |
| 7446930 | Method of inverting polarization by controlling defect density or degree of order of lattice points | Kenji Kitamura, Sunao Kurimura, Masaru Nakamura, Shunji Takekawa, Shunichi Hishida +1 more | 2008-11-04 |
| 7026911 | Point contact array, not circuit, and electronic circuit comprising the same | Masakazu Aono, Tsuyoshi Hasegawa, Tomonobu Nakayama | 2006-04-11 |
| 6891186 | Electronic device having controllable conductance | Masakazu Aono, Tsuyoshi Hasegawa, Tomonobu Nakayama | 2005-05-10 |
| 6833719 | Apparatus for evaluating electrical characteristics | Tsuyoshi Hasegawa, Masakazu Aono, Tomonobu Nakayama, Taichi Okuda, Hirofumi Tanaka | 2004-12-21 |
| 6608306 | Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure | Masakazu Aono, Tomonobu Nakayama | 2003-08-19 |