Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6941811 | Method and apparatus for detecting wafer flaw | Chih-Kun Chen, Yao-Hsiung Kung | 2005-09-13 |
| 6719617 | Slurry homogenizer and supply system | Chih-Pin Hsu, Chih-Kun Chen | 2004-04-13 |