HC

Hsuan-Ko Chen

NT Nanya Technology: 1 patents #447 of 775Top 60%
Overall (All Time): #3,277,055 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7651824 Method for compensating critical dimension variations in photomasks Mei-Li Wang, Chih-Cheng Chin, Pei Cheng Fan 2010-01-26