Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11761753 | Thin films and surface topography measurement using polarization resolved interferometry | — | 2023-09-19 |
| 8818754 | Thin films and surface topography measurement using reduced library | Michael J. Darwin | 2014-08-26 |