Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6265233 | Method for determining crack limit of film deposited on semiconductor wafer | Jason C. S. Chu, Jerry C. S. Lin, Chih-Ta Wu | 2001-07-24 |
| 6242365 | Method for preventing film deposited on semiconductor wafer from cracking | Jason C. S. Chu, Jerry C. S. Lin, Chih-Ta Wu | 2001-06-05 |