Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12352558 | Shape reconstruction method and image measurement device | Shigeki Masumura, Jyota Miyakura, Masaoki Yamagata | 2025-07-08 |
| 10578414 | Inner-wall measuring instrument and offset-amount calculation method | — | 2020-03-03 |
| 10551174 | Calibration method of image measuring device | — | 2020-02-04 |
| 10274313 | Measurement method and measurement program for calculating roughness of a curved surface | Hiroshi Sakai, Yutaka Watanabe, Harumasa Ito, Yuji Kudo | 2019-04-30 |
| 9341460 | Double cone stylus, touch probe, and method of calibrating double cone stylus | Masaki Kurihara, Masanori Arai, Tomoyuki Miyazaki | 2016-05-17 |
| 8416426 | Calibrating jig, profile measuring device, and method of offset calculation | Masaoki Yamagata, Hiraku Ishiyama, Kentaro Nemoto | 2013-04-09 |
| 8139229 | Calibrating jig, profile measuring device, and method of offset calculation | Masaoki Yamagata, Hiraku Ishiyama, Kentaro Nemoto | 2012-03-20 |
| 7882723 | Abnormality detecting method for form measuring mechanism and form measuring mechanism | Masaoki Yamagata | 2011-02-08 |