Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11257205 | Image measuring method and apparatus | Gyokubu Cho, Koichi Komatsu, Akira Takada, Hiroyuki Yoshida, Takashi Hanamura +2 more | 2022-02-22 |
| 10163201 | Hardness test apparatus and hardness testing method | Takeshi Sawa, Takashi Hanamura, Akira Takada | 2018-12-25 |
| 10102631 | Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program | Hiroyuki Yoshida, Akira Takada, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu +3 more | 2018-10-16 |
| 10027885 | Image measuring apparatus | Gyokubu Cho, Akira Takada, Takashi Hanamura | 2018-07-17 |
| 8553181 | Liquid crystal display device | Eishi Yamakawa, Sakae Yoshida, Daichi Hosokawa, Junichi Kobayashi, Atsushi Yamazaki | 2013-10-08 |