TN

Takashi Noda

MI Mitutoyo: 28 patents #13 of 721Top 2%
MI Minolta: 9 patents #209 of 1,109Top 20%
KO Komatsu: 7 patents #246 of 2,087Top 15%
OC Oki Electric Industry Co.: 5 patents #405 of 2,807Top 15%
HI Hitachi: 3 patents #10,712 of 28,497Top 40%
Sumitomo Electric Industries: 2 patents #9,741 of 21,551Top 50%
NE Nec: 1 patents #7,889 of 14,502Top 55%
NS Nippon Steel: 1 patents #2,111 of 4,423Top 50%
SC Synztec Co.: 1 patents #34 of 62Top 55%
TT The University Of Tokyo: 1 patents #1,000 of 2,633Top 40%
KS Komatsu Shisakusho: 1 patents #409 of 885Top 50%
TL Toyota Central R&D Labs: 1 patents #823 of 1,657Top 50%
KM Konica Minolta: 1 patents #1,862 of 2,718Top 70%
KM Konica Minolta: 1 patents #986 of 1,361Top 75%
MC Minolta Co.: 1 patents #942 of 1,416Top 70%
Overall (All Time): #37,886 of 4,157,543Top 1%
61
Patents All Time

Issued Patents All Time

Showing 26–50 of 61 patents

Patent #TitleCo-InventorsDate
9103648 Profile measuring method and profile measuring instrument Hiroshi Kamitani, Naoya Kikuchi 2015-08-11
8910473 Pipe layer and warm-up method for pipe layer Takuya Uemura, Yasuhiko Takeuchi 2014-12-16
8630576 Image forming system, post processing apparatus, sheet feed control method and sheet feed control program Yasuhide Kokura, Yasuomi Mitsui 2014-01-14
8478564 Shape measuring apparatus Kenji Ueda 2013-07-02
8407908 Profile measurement apparatus 2013-04-02
8214587 Storage apparatus and method for controlling storage apparatus Takashi Ochi, Yoshihito Nakagawa 2012-07-03
7958564 Scanning measurement instrument Hiroshi Kamitani, Naoya Kikuchi 2011-06-07
7643963 Apparatus, method and program for measuring surface texture Hiromi Deguchi, Naoya Kikuchi 2010-01-05
7537717 Method of manufacturing two-layer roll and method of manufacturing cylindrical member Junya Hoshi, Takeshi Yanobe, Shinobu Hasegawa 2009-05-26
7392692 Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium 2008-07-01
7376261 Surface scan measuring device and method of forming compensation table for scanning probe Katsuyuki Ogura 2008-05-20
7039550 Surface scan measuring instrument, surface scan measuring method, surface scan measuring program and recording medium 2006-05-02
7023805 Communication connecting device capable of reliably transmitting data to an IP network and a data transmission control method Katsutoshi Tajiri, Rika Kamimura 2006-04-04
7012920 Communication connecting device capable of reducing a load on an IP network and a data output control method Katsutoshi Tajiri, Rika Kamimura 2006-03-14
6977945 Network interface apparatus for controlling the size, coupling or transfer rate of packets on the basis of an IP network delay and a method therefor Katsutoshi Tajiri, Rika Kamimura 2005-12-20
6975420 Communication connecting device with a reliable transmission capability and a data output control method Katsutoshi Tajiri, Rika Kamimura 2005-12-13
6886027 Communication apparatus with address translation for multimedia communication in different address spaces and multimedia communication method compatible with address translation Katsutoshi Tajiri 2005-04-26
6772953 Contactless data carrier Keiichi Iiyama, Shinji Murakami, Yutaka Harada, Takuya Oka, Masaru Tanichi 2004-08-10
D487430 Semiconductor memory element Nobuyoshi Asaka, Takao Ochi, Junichi Shinyashiki 2004-03-09
6701267 Method for calibrating probe and computer-readable medium Kozo Sugita 2004-03-02
6701268 Method for calibrating scanning probe and computer-readable medium therefor Hiromi Deguchi, Koji Takesako 2004-03-02
6460261 V-groove shape measuring method and apparatus by using rotary table Hiromi Deguchi, Katsuyuki Ogura 2002-10-08
6142470 Sorter with bin movement control system Akira Ohhata, Yoshikazu Takesada 2000-11-07
6108613 Probe coordinate system driving apparatus Tetsuo Kimura 2000-08-22
6044569 Measuring method and measuring instrument Motonori Ogihara, Nobuhiro Ishikawa 2000-04-04