Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7633617 | Defective particle measuring apparatus and defective particle measuring method | — | 2009-12-15 |
| 6760060 | Observation apparatus for observing a defect in a moving target object using scattered light | — | 2004-07-06 |
| 6236056 | Defect evaluation apparatus for evaluating defects and shape information thereof in an object or on the surface of an object | — | 2001-05-22 |
| 6118133 | Apparatus and method for observing defect having marks making means | — | 2000-09-12 |
| 6020958 | Atomic absorption spectrophotometer | Hayato Tobe, Hiromi Yamashita, Yasushi Terui | 2000-02-01 |
| 5995216 | Pattern inspection apparatus | Kazumi Fujimoto | 1999-11-30 |
| 5982922 | Pattern inspection apparatus and method | — | 1999-11-09 |
| 5978082 | Atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometer | Yasushi Terui, Hiromi Yamashita, Hayato Tobe | 1999-11-02 |
| 5970624 | Method of drying wood and method of subjecting wood to impregnative treatment | — | 1999-10-26 |
| 5892241 | Apparatus and method for the inspection of scattered resist | — | 1999-04-06 |
| 5822059 | Atomic absorption spectrophotometer and graphite tube type cuvette used for the same | Hayato Tobe, Yoshisada Ebata, Yasushi Terui | 1998-10-13 |
| 5808744 | Apparatus for inspecting repetitive patterns | — | 1998-09-15 |
| 5801827 | Analysis device using chemical combustion flame | Yasushi Terui, Hayato Tobe, Yoshisada Ebata, Hisashi Kimoto | 1998-09-01 |
| 5786887 | Atomic absorption spectrophotometer and atomic absorption spectrochemical analysis | Yoshisada Ebata, Hisashi Kimoto, Hayato Tobe, Yasushi Terui | 1998-07-28 |
| 5748320 | Wiring pattern line width measuring apparatus | — | 1998-05-05 |
| 5471298 | Method and apparatus for measuring size of particle or defect | — | 1995-11-28 |
| 5428655 | Method and apparatus for three-dimensional detection of particles | Masaru Ohtsuka | 1995-06-27 |
| 5424536 | Substrate internal defect and external particle detecting apparatus using s-polarized and p-polarized light | — | 1995-06-13 |
| 5381016 | Method and apparatus for measuring photoluminescence in crystal | — | 1995-01-10 |
| 5298963 | Apparatus for inspecting the surface of materials | Takayuki Tsuzura | 1994-03-29 |
| 5196716 | Method and apparatus for measuring internal defects for position and depth | Hideo Wada, Katsuyuki Hirai | 1993-03-23 |
| 5108178 | Atomic absorption spectrophotometer and electromagnetic shut-off valve for use therein | Konosuke Oishi, Katsuhito Harada, Masamichi Tsukada, Toyoharu Okumoto | 1992-04-28 |
| 5106189 | Zeeman atomic absorption spectrophotometer | Susumu Taira | 1992-04-21 |
| 5077475 | Method for quantitative evaluation method of optical absorption image for determination of resistivity dispersion | Katsuyuki Hirai, Mikio Kimura | 1991-12-31 |
| 4765925 | Solid state laser hosts | Yutaka Anzai, Kiyoshi Yamagishi, Yasuhide Yamaguchi | 1988-08-23 |