Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12352674 | Test method and method for manufacturing semiconductor device | Hidetoshi Ishibashi, Ayumi Minamide, Seiji Oka, Shunji Masumori | 2025-07-08 |
YF
Yurie Furuta
Overall (All Time): #2,433,167 of 4,157,543Top 60%
1
Patents All Time