Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6768133 | Semiconductor device, test method for semiconductor device, and tester for semiconductor device | — | 2004-07-27 |
| 6577150 | Testing apparatus and method of measuring operation timing of semiconductor device | — | 2003-06-10 |
| 5872389 | Semiconductor device having a fuse layer | Keiko Ito, Hiroyuki Takeoka, Masanao Maruta, Masaharu Moriyasu | 1999-02-16 |
| 5072270 | Stacked capacitor type dynamic random access memory | — | 1991-12-10 |
| 4719410 | Redundancy-secured semiconductor device | — | 1988-01-12 |
| 4692901 | Semiconductor memory | Masaki Kumanoya, Kazuyasu Fujishima, Hideshi Miyatake, Hideto Hidaka, Katsumi Dosaka | 1987-09-08 |
| 4672582 | Semiconductor device | Kazuyasu Fujishima, Masaki Kumanoya | 1987-06-09 |