Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6683589 | Surface discharge type plasma display panel with intersecting barrier ribs | Ko Sano, Kanzou Yoshikawa, Takeo Saikatsu, Toyohiro Uchiumi | 2004-01-27 |
| 6638129 | Surface discharge type plasma display panel with intersecting barrier ribs | Ko Sano, Kanzou Yoshikawa, Takeo Saikatsu, Toyohiro Uchiumi | 2003-10-28 |
| 6417620 | Surface discharge plasma display panel having two-dimensional black stripes of specific size and shape | — | 2002-07-09 |
| 6249264 | Surface discharge type plasma display panel with intersecting barrier ribs | Ko Sano, Kanzou Yoshikawa, Takeo Saikatsu, Toyohiro Uchiumi | 2001-06-19 |
| 5723982 | Apparatus for analyzing thin film property | Tadashi Nishioka | 1998-03-03 |
| 5652428 | Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere | Tadashi Nishioka | 1997-07-29 |
| 5550372 | Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices | — | 1996-08-27 |
| 5530253 | Sample stage for scanning probe microscope head | Tadashi Nishioka | 1996-06-25 |
| 5477732 | Adhesion measuring method | Tadashi Nishioka | 1995-12-26 |
| 5469733 | Cantilever for atomic force microscope and method of manufacturing the cantilever | Tadashi Nishioka | 1995-11-28 |
| 5236866 | Metal interconnection layer having reduced hillock formation in semi-conductor device and manufacturing method therefor | — | 1993-08-17 |
| 5193385 | Cantilever for use in atomic force microscope and manufacturing method therefor | Tadashi Nishioka, Hiroshi Koyama | 1993-03-16 |
| 5147824 | Semiconductor wafer | — | 1992-09-15 |
| 5107114 | Fine scanning mechanism for atomic force microscope | Tadashi Nishioka, Hiroshi Koyama | 1992-04-21 |
| 5088290 | Transfer vessel apparatus and method of storing samples | — | 1992-02-18 |
| 5060043 | Semiconductor wafer with notches | — | 1991-10-22 |
| 5043148 | Transfer device | — | 1991-08-27 |
| 5040048 | Metal interconnection layer having reduced hillock formation | — | 1991-08-13 |
| 4947042 | Tunnel unit and scanning head for scanning tunneling microscope | Tadashi Nishioka, Hiroshi Koyama | 1990-08-07 |
| 4945235 | Fine adjustment mechanism for a scanning tunneling microscope | Tadashi Nishioka, Hiroshi Koyama | 1990-07-31 |
| 4880975 | Fine adjustment mechanism for a scanning tunneling microscope | Tadashi Nishioka, Hiroshi Koyama | 1989-11-14 |
| 4856297 | Transfer vessel device and method of transfer using the device | — | 1989-08-15 |
| 4837445 | Coarse adjusting device of scanning tunneling microscope | Tadashi Nishioka, Hiroshi Koyama | 1989-06-06 |