Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972202 | Method of manufacturing and testing a semiconductor device | Kunio Kobayashi | 2005-12-06 |
| 4904934 | Testing apparatus for semiconductor devices | Kiyoji Imanaka, Katsuji Kawaguchi, Hidekazu Iwasaki | 1990-02-27 |