Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11529608 | Carbon dioxide adsorbent and carbon dioxide processing system | Takeshi Okumura, Masahiro NEGAMI, Katsuhiro YOSHIZAWA, Akihito Kawano, Yoshimichi NOMURA +1 more | 2022-12-20 |
| 11394148 | Contact probe and inspection socket provided with contact probe | Kazuaki Arai | 2022-07-19 |
| 11185842 | Carbon dioxide adsorbent, method for manufacturing the same, and carbon dioxide processing system | Takeshi Okumura, Masahiro NEGAMI, Katsuhiro YOSHIZAWA, Akihito Kawano, Yoshimichi NOMURA +1 more | 2021-11-30 |
| 10724495 | Gas engine system | Towa Hirayama, Hiroyoshi Ishii, Yosuke Nonaka, Tomoaki Kizuka, Shigeharu Fujihara +1 more | 2020-07-28 |
| 10551432 | Method of manufacturing semiconductor device | Toshitsugu Ishii, Naohiro Makihira, Jun Matsuhashi | 2020-02-04 |
| 10109568 | Semiconductor device manufacturing method and semiconductor device | Jun Matsuhashi, Naohiro Makihira, Toshitsugu Ishii | 2018-10-23 |
| 9945903 | Semiconductor device manufacturing method | Toshitsugu Ishii, Naohiro Makihira, Jun Matsuhashi | 2018-04-17 |
| 9905482 | Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using test socket terminals | Toshitsugu Ishii, Naohiro Makihira, Jun Matsuhashi | 2018-02-27 |
| 9816449 | Fuel supply controlling device for divided-chamber gas engine | Sekai Miyamoto, Motohiko Nishimura, Yosuke Nonaka | 2017-11-14 |
| 9761501 | Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using socket terminals | Toshitsugu Ishii, Naohiro Makihira, Jun Matsuhashi | 2017-09-12 |
| 9515000 | Method for manufacturing semiconductor device | Toshitsugu Ishii, Naohiro Makihira, Jun Matsuhashi | 2016-12-06 |
| 9291125 | Gas engine, control system and control method for gas engine | Shintaro Yoshihara, Youhei Nakajima, Kenji Yoshimura, Yoshishige Sakai, Yoshirou Tokunaga | 2016-03-22 |
| 8220273 | Cooling structure for gas turbine combustor | — | 2012-07-17 |
| 5847572 | Partly replaceable device for testing a multi-contact integrated circuit chip package | Hiroshi Matsunaga, Takehiko Ohkubo | 1998-12-08 |
| 5658153 | Socket apparatus | Kiyokazu Ikeya, Masahiro Fuchigami, Kunio Kobayashi | 1997-08-19 |
| 4904934 | Testing apparatus for semiconductor devices | Ryouji Nishihashi, Kiyoji Imanaka, Katsuji Kawaguchi | 1990-02-27 |