FM

Fukashi Morishita

Mitsubishi Electric: 43 patents #197 of 25,717Top 1%
RE Renesas Electronics: 36 patents #31 of 4,529Top 1%
RT Renesas Technology: 26 patents #35 of 3,337Top 2%
ML Mitsubishi Electric Engineering Company, Limited: 12 patents #8 of 352Top 3%
Overall (All Time): #12,931 of 4,157,543Top 1%
106
Patents All Time

Issued Patents All Time

Showing 51–75 of 106 patents

Patent #TitleCo-InventorsDate
7095272 Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage 2006-08-22
7068093 Semiconductor integrated circuit with voltage adjusting circuit Takayuki Gyohten 2006-06-27
7064993 Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation Takayuki Gyohten, Masaru Haraguchi 2006-06-20
7030681 Semiconductor device with multiple power sources Akira Yamazaki, Yasuhiko Taito, Nobuyuki Fujii, Mako Okamoto 2006-04-18
7023754 Semiconductor device having standby mode and active mode Mihoko Akiyama 2006-04-04
6965148 Semiconductor memory device and manufacturing method of the same Masakazu Hirose 2005-11-15
6963230 Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage 2005-11-08
6914300 Semiconductor device Masakazu Hirose 2005-07-05
6819619 Semiconductor memory device allowing reduction of an area loss Hiroshi Kato 2004-11-16
6781431 Clock generating circuit Yasuhiko Taito, Akira Yamazaki, Nobuyuki Fujii, Mihoko Akiyama, Mako Okamoto 2004-08-24
6777707 Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing Mihoko Akiyama, Akira Yamazaki, Yasuhiko Taito, Nobuyuki Fujii, Mako Okamoto 2004-08-17
6768354 Multi-power semiconductor integrated circuit device Akira Yamazaki, Yasuhiko Taito, Nobuyuki Fujii, Mihoko Akiyama, Mako Kobayashi 2004-07-27
6704231 Semiconductor memory device with circuit executing burn-in testing Mitsuya Kinoshita 2004-03-09
6700434 Substrate bias voltage generating circuit Nobuyuki Fujii, Mihoko Akiyama, Akira Yamazaki, Mako Kobayashi, Yasuhiko Taito 2004-03-02
6665217 Semiconductor memory device including internal power circuit having tuning function Yasuhiko Taito, Akira Yamazaki, Mako Okamoto, Nobuyuki Fujii 2003-12-16
6614270 Potential detecting circuit having wide operating margin and semiconductor device including the same Mako Okamoto, Yasuhiko Taito, Akira Yamazaki, Mihoko Akiyama, Nobuyuki Fujii 2003-09-02
6593642 Semiconductor device provided with potential transmission line Mako Okamoto, Yasuhiko Taito, Akira Yamazaki, Nobuyuki Fujii 2003-07-15
6519191 Semiconductor integrated circuit device having an internal voltage generation circuit layout easily adaptable to change in specification 2003-02-11
6515934 Semiconductor device including internal potential generating circuit allowing tuning in short period of time and reduction of chip area Mako Kobayashi 2003-02-04
6515461 Voltage downconverter circuit capable of reducing current consumption while keeping response rate Mihoko Akiyama, Akira Yamazaki, Yasuhiko Taito, Mako Kobayashi, Nobuyuki Fujii 2003-02-04
6501326 Semiconductor integrated circuit Nobuyuki Fujii, Akira Yamazaki, Yasuhiko Taito, Mako Okamoto 2002-12-31
6483357 Semiconductor device reduced in through current Hiroshi Kato 2002-11-19
6472926 Internal voltage generation circuit Yasuhiko Taito, Akira Yamazaki, Mako Kobayashi, Mihoko Akiyama, Nobuyuki Fujii 2002-10-29
6434078 Semiconductor device allowing external setting of internal power supply voltage generated by a voltage down converter at the time of testing 2002-08-13
6429729 Semiconductor integrated circuit device having circuit generating reference voltage Mako Kobayashi, Mihoko Akiyama, Yasuhiko Taito, Akira Yamazaki, Nobuyuki Fujii 2002-08-06