SY

Shigekazu Yamada

Micron: 64 patents #261 of 6,345Top 5%
Fujitsu Limited: 15 patents #1,986 of 24,456Top 9%
SL Spansion Llc.: 6 patents #149 of 769Top 20%
AM AMD: 4 patents #2,565 of 9,279Top 30%
IN Intel: 4 patents #8,473 of 30,777Top 30%
FA Fasl: 2 patents #14 of 52Top 30%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
📍 Tokyo, CA: #83 of 583 inventorsTop 15%
Overall (All Time): #17,151 of 4,157,543Top 1%
92
Patents All Time

Issued Patents All Time

Showing 26–50 of 92 patents

Patent #TitleCo-InventorsDate
10347320 Controlling discharge of a control gate voltage 2019-07-09
10170196 Apparatuses and methods to control body potential in 3D non-volatile memory operations Han Zhao, Akira Goda, Krishna K. Parat, Aurelio Giancarlo Mauri, Haitao Liu +2 more 2019-01-01
10056149 Semiconductor memory column decoder device and method Tomoharu Tanaka 2018-08-21
9881686 Apparatuses and methods to control body potential in 3D non-volatile memory operations Han Zhao, Akira Goda, Krishna K. Parat, Aurelio Giancarlo Mauri, Haitao Liu +2 more 2018-01-30
9704542 Automatic word line leakage measurement circuitry 2017-07-11
9697912 Leakage current detection Feng Pan 2017-07-04
9536618 Apparatuses and methods to control body potential in memory operations Han Zhao, Akira Goda, Krishna K. Parat, Aurielo Giancarlo Mauri, Haitao Liu +2 more 2017-01-03
9466380 Semiconductor memory column decoder device and method Tomoharu Tanaka 2016-10-11
9443610 Leakage current detection Feng Pan, Allahyar Vahidimowlavi, Jae-Kwan Park, Cairong Hu, Kalyan C. Kavalipurapu 2016-09-13
9424936 Current leakage reduction in 3D NAND memory Toru Tanzawa, Akira Goda, Hiroyuki Sanda 2016-08-23
9312018 Sensing with boost 2016-04-12
9269410 Leakage measurement systems 2016-02-23
9183948 Apparatuses, integrated circuits, and methods for measuring leakage current 2015-11-10
9159452 Automatic word line leakage measurement circuitry 2015-10-13
9064577 Apparatuses and methods to control body potential in memory operations Han Zhao, Akira Goda, Krishna K. Parat, Aurelio Giancarlo Mauri, Haitao Liu +2 more 2015-06-23
8947946 Leakage measurement systems 2015-02-03
8873297 Select gate programming in a memory device Aaron Yip 2014-10-28
8867290 Apparatuses, integrated circuits, and methods for measuring leakage current 2014-10-21
8760933 Circuits, systems, and methods for driving high and low voltages on bit lines in non-volatile memory 2014-06-24
8634264 Apparatuses, integrated circuits, and methods for measuring leakage current 2014-01-21
8588007 Leakage measurement systems 2013-11-19
8542534 Select gate programming in a memory device Aaron Yip 2013-09-24
8503249 Semiconductor memory column decoder device and method Tomoharu Tanaka 2013-08-06
8482986 Word line drivers in non-volatile memory device and method having a shared power bank and processor-based systems using same 2013-07-09
8462559 Memory erase methods and devices Tomoharu Tanaka 2013-06-11