Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11789835 | Test input/output speed conversion and related apparatuses and methods | Sang Hoon Shin, Won Joo Yun | 2023-10-17 |
| 11488879 | Methods and apparatuses to wafer-level test adjacent semiconductor die | Boon Hor Lam | 2022-11-01 |