PC

Pinchou Chiang

Micron: 2 patents #3,728 of 6,345Top 60%
Overall (All Time): #1,765,129 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12002526 Defect detection during program verify in a memory sub-system Arvind Muralidharan, James I. Esteves, Michele Piccardi, Theodore T. Pekny 2024-06-04
11315647 Defect detection during program verify in a memory sub-system Arvind Muralidharan, James I. Esteves, Michele Piccardi, Theodore T. Pekny 2022-04-26