Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12002526 | Defect detection during program verify in a memory sub-system | Pinchou Chiang, Arvind Muralidharan, Michele Piccardi, Theodore T. Pekny | 2024-06-04 |
| 11315647 | Defect detection during program verify in a memory sub-system | Pinchou Chiang, Arvind Muralidharan, Michele Piccardi, Theodore T. Pekny | 2022-04-26 |
| 9267980 | Capacitance evaluation apparatuses and methods | Xinwei Guo, Arvind Muralidharan, Nicholas Hendrickson | 2016-02-23 |