FR

Frankie F. Roohparvar

Micron: 510 patents #6 of 6,345Top 1%
RR Round Rock Research: 9 patents #16 of 239Top 7%
MT Mircon Technology: 1 patents #1 of 36Top 3%
📍 Monte Sereno, CA: #1 of 229 inventorsTop 1%
🗺 California: #97 of 386,348 inventorsTop 1%
Overall (All Time): #351 of 4,157,543Top 1%
522
Patents All Time

Issued Patents All Time

Showing 476–500 of 522 patents

Patent #TitleCo-InventorsDate
6046615 Level detection circuit Christophe J. Chevallier, Michael S. Briner 2000-04-04
6028798 Low voltage test mode operation enable scheme with hardware safeguard 2000-02-22
6014332 Flash memory with adjustable write operation timing 2000-01-11
5959485 Controllable one-shot circuit and method for controlling operation of memory circuit using same 1999-09-28
5956277 Circuit and method for performing tests on memory array cells using external sense amplifier reference current 1999-09-21
5956272 Programming pulse with varying amplitude 1999-09-21
5950145 Low voltage test mode operation enable scheme with hardware safeguard 1999-09-07
5943263 Apparatus and method for programming voltage protection in a non-volatile memory system 1999-08-24
5933434 Memory system having internal state monitoring circuit 1999-08-03
5930188 Memory circuit for performing threshold voltage tests on cells of a memory array 1999-07-27
5930168 Flash memory with adjustable write operation timing 1999-07-27
5900741 CMOS buffer having stable threshold voltage 1999-05-04
5901108 Apparatus for externally timing high voltage cycles of non-volatile memory system 1999-05-04
5880996 Memory system having non-volatile data storage structure for memory control parameters and method 1999-03-09
5864499 Non-volatile data storage unit and method of controlling same Michael S. Briner 1999-01-26
5864569 Method and apparatus for performing error correction on data read from a multistate memory 1999-01-26
5825782 Non-volatile memory system including apparatus for testing memory elements by writing and verifying data patterns 1998-10-20
5825700 Low voltage test mode operation enable scheme with hardware safeguard 1998-10-20
5808946 Parallel processing redundancy scheme for faster access times and lower die area 1998-09-15
5801985 Memory system having programmable control parameters Darrell Rinerson, Christophe J. Chevallier, Michael S. Briner 1998-09-01
5793775 Low voltage test mode operation enable scheme with hardware safeguard 1998-08-11
5790459 Memory circuit for performing threshold voltage tests on cells of a memory array 1998-08-04
5774401 Data input/output circuit for performing high speed memory data read operation 1998-06-30
5767711 Level detection circuit and method Christophe J. Chevallier, Michael S. Briner 1998-06-16
5761130 Data input/output circuit for performing high speed memory data read operation 1998-06-02