ES

Eric J. Stave

Micron: 41 patents #457 of 6,345Top 8%
NT Nanya Technology: 1 patents #447 of 775Top 60%
📍 Meridian, ID: #27 of 654 inventorsTop 5%
🗺 Idaho: #305 of 8,810 inventorsTop 4%
Overall (All Time): #61,409 of 4,157,543Top 2%
46
Patents All Time

Issued Patents All Time

Showing 26–46 of 46 patents

Patent #TitleCo-InventorsDate
9122570 Data pattern generation for I/O training and characterization Timothy M. Hollis, Jeffrey P. Wright, Kang-Yong Kim 2015-09-01
7664999 Real time testing using on die termination (ODT) circuit 2010-02-16
7574634 Real time testing using on die termination (ODT) circuit 2009-08-11
7274606 Low power chip select (CS) latency option 2007-09-25
7167401 Low power chip select (CS) latency option 2007-01-23
6788126 Semiconductor buffer circuit with a transition delay circuit 2004-09-07
6707136 Multi-layer lead frame for a semiconductor device 2004-03-16
6707312 Pseudo variable resistor for tester platform 2004-03-16
6515353 Multi-layer lead frame for a semiconductor device 2003-02-04
6515529 Semiconductor buffer circuit with a transition delay circuit 2003-02-04
6438043 Adjustable I/O timing from externally applied voltage Dean D. Gans, Joseph T. Pawlowski 2002-08-20
6307255 Multi-layer lead frame for a semiconductor device 2001-10-23
6278310 Semiconductor buffer circuit with a transition delay circuit 2001-08-21
6166576 Method and apparatus for controlling timing of digital components 2000-12-26
6154078 Semiconductor buffer circuit with a transition delay circuit 2000-11-28
6124630 Multi-layer lead frame for a semiconductor device 2000-09-26
6002623 Semiconductor memory with test circuit Phillip G. Wald 1999-12-14
5965936 Multi-layer lead frame for a semiconductor device 1999-10-12
5892720 Semiconductor memory with test circuit Phillip G. Wald 1999-04-06
5734198 Multi-layer lead frame for a semiconductor device 1998-03-31
5684809 Semiconductor memory with test circuit Phillip G. Wald 1997-11-04