Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11152333 | Semiconductor device packages with enhanced heat management and related systems | — | 2021-10-19 |
| 8509016 | Methods and memory devices for repairing memory cells | Seth A. Eichmeyer, Tim Cowles, Patrick J. Mullarkey | 2013-08-13 |
| 8144534 | Methods and memory devices for repairing memory cells | Seth A. Eichmeyer, Tim Cowles, Patrick J. Mullarkey | 2012-03-27 |
| 7952169 | Isolation circuit | Timothy B. Cowles | 2011-05-31 |
| 7550762 | Isolation circuit | Timothy B. Cowles | 2009-06-23 |
| 7378290 | Isolation circuit | Timothy B. Cowles | 2008-05-27 |
| 7344899 | Die assembly and method for forming a die on a wafer | — | 2008-03-18 |
| 7251173 | Combination column redundancy system for a memory array | Michael A. Shore | 2007-07-31 |
| 7208758 | Dynamic integrated circuit clusters, modules including same and methods of fabricating | Kevin G. Duesman, Timothy B. Cowles | 2007-04-24 |
| 7170091 | Probe look ahead: testing parts not currently under a probehead | — | 2007-01-30 |
| 7122829 | Probe look ahead: testing parts not currently under a probehead | — | 2006-10-17 |
| 7026646 | Isolation circuit | Timothy B. Cowles | 2006-04-11 |
| 6967348 | Signal sharing circuit with microelectric die isolation features | Timothy B. Cowles | 2005-11-22 |
| 6630685 | Probe look ahead: testing parts not currently under a probehead | — | 2003-10-07 |
| 6522161 | Method and apparatus for properly disabling high current parts in a parallel test environment | Phillip A. Rasmussen | 2003-02-18 |
| 6275058 | Method and apparatus for properly disabling high current parts in a parallel test environment | Phillip A. Rasmussen | 2001-08-14 |