| 11152333 |
Semiconductor device packages with enhanced heat management and related systems |
— |
2021-10-19 |
| 8509016 |
Methods and memory devices for repairing memory cells |
Seth A. Eichmeyer, Tim Cowles, Patrick J. Mullarkey |
2013-08-13 |
| 8144534 |
Methods and memory devices for repairing memory cells |
Seth A. Eichmeyer, Tim Cowles, Patrick J. Mullarkey |
2012-03-27 |
| 7952169 |
Isolation circuit |
Timothy B. Cowles |
2011-05-31 |
| 7550762 |
Isolation circuit |
Timothy B. Cowles |
2009-06-23 |
| 7378290 |
Isolation circuit |
Timothy B. Cowles |
2008-05-27 |
| 7344899 |
Die assembly and method for forming a die on a wafer |
— |
2008-03-18 |
| 7251173 |
Combination column redundancy system for a memory array |
Michael A. Shore |
2007-07-31 |
| 7208758 |
Dynamic integrated circuit clusters, modules including same and methods of fabricating |
Kevin G. Duesman, Timothy B. Cowles |
2007-04-24 |
| 7170091 |
Probe look ahead: testing parts not currently under a probehead |
— |
2007-01-30 |
| 7122829 |
Probe look ahead: testing parts not currently under a probehead |
— |
2006-10-17 |
| 7026646 |
Isolation circuit |
Timothy B. Cowles |
2006-04-11 |
| 6967348 |
Signal sharing circuit with microelectric die isolation features |
Timothy B. Cowles |
2005-11-22 |
| 6630685 |
Probe look ahead: testing parts not currently under a probehead |
— |
2003-10-07 |
| 6522161 |
Method and apparatus for properly disabling high current parts in a parallel test environment |
Phillip A. Rasmussen |
2003-02-18 |
| 6275058 |
Method and apparatus for properly disabling high current parts in a parallel test environment |
Phillip A. Rasmussen |
2001-08-14 |
