JW

Joel Weinstein

MM Micro Motion: 34 patents #5 of 279Top 2%
HO Hologic: 4 patents #134 of 450Top 30%
📍 Boulder, CO: #97 of 5,018 inventorsTop 2%
🗺 Colorado: #636 of 40,980 inventorsTop 2%
Overall (All Time): #77,584 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
8831896 Meter electronics and fluid quantification method for a fluid being transferred Steven M. Jones 2014-09-09
8720281 Method and apparatus for determining a zero offset in a vibrating flow meter Paul J. Hays 2014-05-13
8695440 Method and apparatus for determining and compensating for a change in a differential zero offset of a vibrating flow meter Paul J. Hays, Goldino Alves 2014-04-15
8650929 Method and apparatus for determining a flow rate error in a vibrating flow meter Anthony William Pankratz 2014-02-18
8589091 System, method, and computer program product for detecting a process disturbance in a vibrating flow device Charles Paul Stack 2013-11-19
8448491 Vibratory flow meter and method for correcting for an entrained phase in a two-phase flow of a flow material Craig Brainerd Van Cleve 2013-05-28
8327717 Very high frequency vibratory flow meter 2012-12-11
8327718 Very low frequency vibratory flow meter 2012-12-11
8322230 Vibratory flow meter for determining one or more flow fluid characteristics of a multi-phase flow fluid 2012-12-04
8289179 Vibratory flow meter and method for correcting for entrained gas in a flow material Mark James Bell 2012-10-16
6500119 Obtaining images of structures in bodily tissue Alan I. West, David Krag, Navin Dewagan 2002-12-31
6282258 Method of assessing bone characteristics using digital 2-dimensional x-ray detector Jay A. Stein, Howard P. Weiss, Vincent E. Quinn, John A. Shepherd, Kevin Wilson 2001-08-28
6029078 System for assessing bone characteristics Donald Barry 2000-02-22
5785041 System for assessing bone characteristics Donald Barry 1998-07-28
5687211 Bone densitometry scanning system and method for selecting scan parametric values using x-ray thickness measurement Noah Berger, Dao-Yi Zhu 1997-11-11