Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12138128 | Ultrasound probe with integrated electronics | Michael Brodsky, Alice M. Chiang, William M. Wong, Xingbai He | 2024-11-12 |
| 12115023 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2024-10-15 |
| 12102480 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2024-10-01 |
| 11857363 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2024-01-02 |
| 11547382 | Networked ultrasound system and method for imaging a medical procedure using an invasive probe | Michael Brodsky, Mark LaForest, Alice M. Chiang, William M. Wong, Xingbai He +1 more | 2023-01-10 |
| 11179138 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2021-11-23 |
| 10667790 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2020-06-02 |
| 9877699 | Tablet ultrasound system | Alice M. Chiang, William M. Wong | 2018-01-30 |
| 9402601 | Methods for controlling an ultrasound imaging procedure and providing ultrasound images to an external non-ultrasound application via a network | Michael Brodsky, Alice M. Chiang, Mark LaForest | 2016-08-02 |
| 8551000 | Ultrasound 3D imaging system | Alice M. Chiang, Xingbai He, William M. Wong | 2013-10-08 |
| 6009147 | X-ray bone densitometry | Jay A. Stein, Steven Teta, Donald Barry, Richard E. Cabral, Tracy L. Ramsdell +6 more | 1999-12-28 |
| 5838765 | Whole-body x-ray bone densitometry using a narrow-angle fan beam, including variable fan beam displacement between scan passes | Russell J. Gershman, Richard E. Cabral, Jay A. Stein | 1998-11-17 |
| 5771272 | X-ray densitometer detector calibration by beam flattening and continuous dark scanning | Tom Richardson, Eric von Stetten, Howard P. Weiss | 1998-06-23 |
| 5748705 | X-ray bone densitometry | Jay A. Stein | 1998-05-05 |
| 5715820 | X-ray bone densitometry using multiple pass scanning with image blending | Jay A. Stein, Richard E. Cabral | 1998-02-10 |
| 5687211 | Bone densitometry scanning system and method for selecting scan parametric values using x-ray thickness measurement | Joel Weinstein, Dao-Yi Zhu | 1997-11-11 |