NB

Noah Berger

TE Teratech: 10 patents #5 of 32Top 20%
HO Hologic: 6 patents #92 of 450Top 25%
Overall (All Time): #287,246 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12138128 Ultrasound probe with integrated electronics Michael Brodsky, Alice M. Chiang, William M. Wong, Xingbai He 2024-11-12
12115023 Tablet ultrasound system Alice M. Chiang, William M. Wong 2024-10-15
12102480 Tablet ultrasound system Alice M. Chiang, William M. Wong 2024-10-01
11857363 Tablet ultrasound system Alice M. Chiang, William M. Wong 2024-01-02
11547382 Networked ultrasound system and method for imaging a medical procedure using an invasive probe Michael Brodsky, Mark LaForest, Alice M. Chiang, William M. Wong, Xingbai He +1 more 2023-01-10
11179138 Tablet ultrasound system Alice M. Chiang, William M. Wong 2021-11-23
10667790 Tablet ultrasound system Alice M. Chiang, William M. Wong 2020-06-02
9877699 Tablet ultrasound system Alice M. Chiang, William M. Wong 2018-01-30
9402601 Methods for controlling an ultrasound imaging procedure and providing ultrasound images to an external non-ultrasound application via a network Michael Brodsky, Alice M. Chiang, Mark LaForest 2016-08-02
8551000 Ultrasound 3D imaging system Alice M. Chiang, Xingbai He, William M. Wong 2013-10-08
6009147 X-ray bone densitometry Jay A. Stein, Steven Teta, Donald Barry, Richard E. Cabral, Tracy L. Ramsdell +6 more 1999-12-28
5838765 Whole-body x-ray bone densitometry using a narrow-angle fan beam, including variable fan beam displacement between scan passes Russell J. Gershman, Richard E. Cabral, Jay A. Stein 1998-11-17
5771272 X-ray densitometer detector calibration by beam flattening and continuous dark scanning Tom Richardson, Eric von Stetten, Howard P. Weiss 1998-06-23
5748705 X-ray bone densitometry Jay A. Stein 1998-05-05
5715820 X-ray bone densitometry using multiple pass scanning with image blending Jay A. Stein, Richard E. Cabral 1998-02-10
5687211 Bone densitometry scanning system and method for selecting scan parametric values using x-ray thickness measurement Joel Weinstein, Dao-Yi Zhu 1997-11-11