YG

YiWen Ge

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #38 of 125Top 35%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #37 of 122Top 35%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #36 of 119Top 35%
Overall (All Time): #2,816,367 of 4,157,543Top 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10782201 Center of gravity offset detection method and platform scale Zhiqiang Wang, Genjun Ji, Shaowen Zheng, Douglas Bliss 2020-09-22