GJ

Genjun Ji

MT Mettler-Toledo (Changzhou) Measurement Technology: 2 patents #26 of 125Top 25%
MI Mettler-Toledo (Changzhou) Precision Instruments: 2 patents #23 of 122Top 20%
MC Mettler-Toledo International Trading (Shanghai) Co.: 2 patents #22 of 119Top 20%
Overall (All Time): #1,723,721 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12352617 Method and system for eccentric load error correction Shilong Wang, Yujuan Zha, Song Zhang, Qiang Fu, Jinkang Han +1 more 2025-07-08
10782201 Center of gravity offset detection method and platform scale Zhiqiang Wang, YiWen Ge, Shaowen Zheng, Douglas Bliss 2020-09-22