Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9903750 | Method and device for determining information relating to the mass of a semiconductor wafer | Adrian Kiermasz | 2018-02-27 |
| 9818658 | Semiconductor wafer processing methods and apparatus | Adrian Kiermasz | 2017-11-14 |
| 9349624 | Semiconductor wafer monitoring apparatus and method | — | 2016-05-24 |
| 9310244 | Semiconductor wafer metrology apparatus and method | — | 2016-04-12 |
| 9228886 | Semiconductor wafer weight metrology apparatus | — | 2016-01-05 |
| 8683880 | Semiconductor wafer metrology apparatus and method | — | 2014-04-01 |
| 8357548 | Semiconductor wafer metrology apparatus and method | — | 2013-01-22 |
| 8200353 | Measuring apparatus | Adrian Kiermasz | 2012-06-12 |
| 8200447 | Measuring apparatus | Adrian Kiermasz | 2012-06-12 |
| 7892863 | Measuring apparatus | Adrian Kiermasz | 2011-02-22 |
| 7340372 | Apparatus and method for investigating parameters of layers deposited on semiconductor wafers | — | 2008-03-04 |
| 7020577 | Apparatus and method for investigating semiconductors wafer | — | 2006-03-28 |
| 6627535 | Methods and apparatus for forming a film on a substrate | John MacNeil, Knut Beekman | 2003-09-30 |