Issued Patents All Time
Showing 26–33 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6467076 | Method and apparatus for submicron IC design | — | 2002-10-15 |
| 6455205 | Method and apparatus for determining phase shifts and trim masks for an integrated circuit | Kyohei Sakajiri | 2002-09-24 |
| 6430737 | Convergence technique for model-based optical and process correction | Emile Y. Sahouria | 2002-08-06 |
| 6425113 | Integrated verification and manufacturability tool | Leigh Anderson, Laurence W. Grodd, Emile Y. Sahouria | 2002-07-23 |
| 6415421 | Integrated verification and manufacturability tool | Leigh Anderson, Laurence W. Grodd, Emile Y. Sahouria, Siqiong You | 2002-07-02 |
| 6335128 | Method and apparatus for determining phase shifts and trim masks for an integrated circuit | Kyohei Sakajiri | 2002-01-01 |
| 6301697 | Streamlined IC mask layout optical and process correction through correction reuse | — | 2001-10-09 |
| 6249904 | Method and apparatus for submicron IC design using edge fragment tagging to correct edge placement distortion | — | 2001-06-19 |