Issued Patents All Time
Showing 26–48 of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7387027 | Characterization of materials with optically shaped acoustic waveforms | Jaime D. Choi, Benjamin Paxton, Thomas Feurer, Masashi Yamaguchi | 2008-06-17 |
| 7348569 | Acceleration of charged particles using spatially and temporally shaped electromagnetic radiation | Thomas Feurer, Darius H. Torchinsky | 2008-03-25 |
| 6795198 | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry | Martin Fuchs, Matthew Banet, John A. Rogers | 2004-09-21 |
| 6717717 | Dynamic wavelength shifting method | — | 2004-04-06 |
| 6482138 | Rotational friction exercise device selectively attached to a support surface | — | 2002-11-19 |
| 6479822 | System and Method for terahertz frequency measurements | Timothy F. Crimmins | 2002-11-12 |
| 6356349 | Polariton wave imaging | Richard A. Koehl, Satoru Adachi | 2002-03-12 |
| 6348967 | Method and device for measuring the thickness of opaque and transparent films | John A. Rogers, Matthew Banet, John Hanselman, Martin Fuchs | 2002-02-19 |
| 6349128 | Method and device using x-rays to measure thickness and composition of thin films | — | 2002-02-19 |
| 6204926 | Methods and system for optically correlating ultrashort optical waveforms | Alexi A. Maznev, Timothy F. Crimmins | 2001-03-20 |
| 6081330 | Method and device for measuring the thickness of opaque and transparent films | John A. Rogers, Matthew Banet, John Hanselman, Martin Fuchs | 2000-06-27 |
| 6075640 | Signal processing by optically manipulating polaritons | — | 2000-06-13 |
| 6069703 | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure | Matthew Banet, Martin Fuchs, John A. Rogers, Timothy F. Crimmins, Alexei Maznev | 2000-05-30 |
| 5999308 | Methods and systems for introducing electromagnetic radiation into photonic crystals | John D. Joannopoulos | 1999-12-07 |
| 5982482 | Determining the presence of defects in thin film structures | John A. Rogers | 1999-11-09 |
| 5812261 | Method and device for measuring the thickness of opaque and transparent films | John A. Rogers, Matthew Banet, John Hanselman, Martin Fuchs | 1998-09-22 |
| 5734470 | Device and method for time-resolved optical measurements | John A. Rogers | 1998-03-31 |
| 5719650 | High-fidelity spatial light modulator | Marc M. Wefers | 1998-02-17 |
| 5682262 | Method and device for generating spatially and temporally shaped optical waveforms | Marc M. Wefers | 1997-10-28 |
| 5672830 | Measuring anisotropic mechanical properties of thin films | John A. Rogers, Lisa Dhar | 1997-09-30 |
| 5662564 | Exercise device | — | 1997-09-02 |
| 5633711 | Measurement of material properties with optically induced phonons | Anil Raj Duggal, John A. Rogers | 1997-05-27 |
| 5546811 | Optical measurements of stress in thin film materials | John A. Rogers | 1996-08-20 |