Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE48901 | Current measurement system | Robert Mossel, Kaustubh Prabodh Padhye, Eric de Kok, Willem Jacob Vis | 2022-01-25 |
| 9644995 | Current measurement system | Robert Mossel, Kaustubh Prabodh Padhye, Eric de Kok, Willem Jacob Vis | 2017-05-09 |
| 9400195 | Active shield for capacitive measurement system | Robert Mossel, Kaustubh Prabodh Padhye, Eric de Kok, Willem Jacob Vis | 2016-07-26 |
| 9395636 | Lithography system for processing a target, such as a wafer, and a method for operating a lithography system for processing a target, such as a wafer | Guido De Boer, Niels Vergeer, Godefridus Cornelius Antonius Couweleers, Laurens Plandsoen | 2016-07-19 |
| 9383662 | Lithography system for processing at least a part of a target | Niels Vergeer, Guido De Boer, Godefridus Cornelius Antonius Couweleers, Laurens Plandsoen | 2016-07-05 |
| 9201315 | Lithography system for processing a target, such as a wafer, a method for operating a lithography system for processing a target, such as a wafer and a substrate for use in such a lithography system | Guido De Boer, Niels Vergeer, Godefridus Cornelius Antonius Couweleers, Laurens Plandsoen | 2015-12-01 |