Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5580828 | Method for chemical surface passivation for in-situ bulk lifetime measurement of silicon semiconductor material | Tamas Horanyi | 1996-12-03 |
| 5406214 | Method and apparatus for measuring minority carrier lifetime in semiconductor materials | Janos Boda, Peter Horvath, Zoltan Mirk, Tibor Pavelka | 1995-04-11 |
| 4995939 | Method and apparatus for determining the layer thickness of semiconductor layer structures | Katalin Erdélyi, Maria Somogyi, Janos Boda, Gyorgy Fule, Gabor Aszodi | 1991-02-26 |
| 4839588 | Method for the examination of electrically active impurities of semiconductor materials or structures and measuring arrangement for carrying out the method | Wolfgang Jantsch | 1989-06-13 |
| 4571541 | Method for determining charged energy states of semiconductor or insulator materials by using deep level transient spectroscopy, and an apparatus for carrying out the method | Janos Boda, Ferenc Toth, Peter Horvath, Laszlo Benkovics, Laszlo Dozsa | 1986-02-18 |
| 4437060 | Method for deep level transient spectroscopy scanning and apparatus for carrying out the method | Peter Horvath, Ferenc Toth, Jozsef Kiss, Janos Boda | 1984-03-13 |