Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11960203 | Method of forming patterns on substrate by double nanoimprint lithography | Chih-Hsien Tang | 2024-04-16 |
| 7141179 | Monitoring semiconductor wafer defects below one nanometer | Wu-An Weng, Wang-Tsai Hsu, Kun Liu | 2006-11-28 |