Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7141179 | Monitoring semiconductor wafer defects below one nanometer | Wu-An Weng, Kun Liu, Yi-Chieh Lai | 2006-11-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7141179 | Monitoring semiconductor wafer defects below one nanometer | Wu-An Weng, Kun Liu, Yi-Chieh Lai | 2006-11-28 |