Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6684164 | True defect monitoring through repeating defect deletion | Kung-Yi Chen, Wei-Ming Chen, Mao-I Ting, Lien-Che Ho | 2004-01-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6684164 | True defect monitoring through repeating defect deletion | Kung-Yi Chen, Wei-Ming Chen, Mao-I Ting, Lien-Che Ho | 2004-01-27 |