KC

Kung-Yi Chen

MC Macronix International Co.: 1 patents #718 of 1,241Top 60%
Overall (All Time): #3,468,369 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6684164 True defect monitoring through repeating defect deletion Wei-Ming Chen, Shu-Ling Ku, Mao-I Ting, Lien-Che Ho 2004-01-27