Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215444 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Donald S. Gibson, Filipp V. Ignatovich | 2022-01-04 |
| 10761021 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Donald S. Gibson, Filipp V. Ignatovich | 2020-09-01 |
| 10190977 | Method of measurement of multilayer structures | Michael A. Marcus, Donald S. Gibson, Filipp V. Ignatovich | 2019-01-29 |
| 8610899 | Rotational and linear system and methods for scanning of objects | Stephen Heveron-Smith, Vincent T. LaManna, David Baranson | 2013-12-17 |