Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215444 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Kyle J. Hadcock, Filipp V. Ignatovich | 2022-01-04 |
| 10761021 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Kyle J. Hadcock, Filipp V. Ignatovich | 2020-09-01 |
| 10190977 | Method of measurement of multilayer structures | Michael A. Marcus, Kyle J. Hadcock, Filipp V. Ignatovich | 2019-01-29 |
| 10006754 | Associated interferometers using multi-fiber optic delay lines | Filipp V. Ignatovich, Michael A. Marcus | 2018-06-26 |
| 9958355 | Apparatus and method for evaluation of optical elements | Filipp V. Ignatovich, Michael A. Marcus | 2018-05-01 |
| 9448058 | Associated interferometers using multi-fiber optic delay lines | Filipp V. Ignatovich, Michael A. Marcus | 2016-09-20 |
| 9341541 | Apparatus and method for evaluation of optical elements | Filipp V. Ignatovich, Michael A. Marcus | 2016-05-17 |
| 9019485 | Apparatus and method for evaluation of optical elements | Filipp V. Ignatovich, Michael A. Marcus | 2015-04-28 |