Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D693709 | Locator device | Noel Lee, Kendrew Lee, Claudio Turrisi | 2013-11-19 |
| 7379836 | Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage | Philippe Schoenborn, Ramit Bhandari, Anh-Ha Tran | 2008-05-27 |
| 5910873 | Field oxide transistor based feedback circuit for electrical overstress protection | Luis Sergio V. Boluna, Tuong Hai Hoang, Larry W. DeClue | 1999-06-08 |