Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5796265 | Method for metal delay testing in semiconductor devices | — | 1998-08-18 |
| 5670892 | Apparatus and method for measuring quiescent current utilizing timeset switching | — | 1997-09-23 |
| 5631567 | Process for predicting propagation delay using linear interpolation | Chris J. Day | 1997-05-20 |
| 5631596 | Process monitor for CMOS integrated circuits | Teh-Kuin Lee | 1997-05-20 |