Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7152194 | Method and circuit for scan testing latch based random access memory | David Vinke, Ekambaram Balaji | 2006-12-19 |
GF
Giuseppe Fornaciari
Overall (All Time): #3,436,958 of 4,157,543Top 85%
1
Patents All Time