Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6594604 | S-parameter measurement system for wideband non-linear networks | Donald Metzger, David B. Marshall | 2003-07-15 |
| 6288454 | Semiconductor wafer having a layer-to-layer alignment mark and method for fabricating the same | Derryl D. J. Allman, Charles W. Jurgensen, Brian R. Lee | 2001-09-11 |
| 6136662 | Semiconductor wafer having a layer-to-layer alignment mark and method for fabricating the same | Derryl D. J. Allman, Charles W. Jurgensen, Brian R. Lee | 2000-10-24 |