Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5497076 | Determination of failure criteria based upon grain boundary electromigration in metal alloy films | Ratan K. Choudhury | 1996-03-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5497076 | Determination of failure criteria based upon grain boundary electromigration in metal alloy films | Ratan K. Choudhury | 1996-03-05 |