Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4878755 | Process and device for measuring the optical properties of thin layers | Hans-Joachim Siegmund | 1989-11-07 |
| 4469713 | Method of and photometric arrangement for measuring and controlling the thickness of optically effective coatings | Alfons Zoller | 1984-09-04 |
| 4207835 | Arrangement and photometer for measuring and controlling the thickness of optically active thin layers | Gernot Thorn, Hans-Peter Ehrl | 1980-06-17 |