Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9970885 | Inspection apparatus and inspection method | Hiroto Nozawa, Kuniaki Takeda, Kenshi Ishiwatari, Ryoichiro Satoh | 2018-05-15 |
| 9013787 | Microscope and inspection apparatus | Haruhiko Kusunose | 2015-04-21 |