Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10803576 | Defect inspection apparatus and defect inspection method | Osamu Nagano | 2020-10-13 |
| 9686749 | Portable terminal and display control method | Keisuke Nakaya, Toshiaki Nade, Yasuhiro Miki, Tooru Takahashi | 2017-06-20 |