Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12237377 | SiC semiconductor substrate, and, production method therefor and production device therefor | Tadaaki Kaneko, Koji Ashida, Daichi Dojima | 2025-02-25 |
| 12131960 | Temperature distribution evaluation method, temperature distribution evaluation device, and soaking range evaluation method | Tadaaki Kaneko, Daichi Dojima, Koji Ashida | 2024-10-29 |
| 12020928 | SiC semiconductor substrate, method for manufacturing same, and device for manufacturing same | Tadaaki Kaneko, Koji Ashida, Daichi Dojima | 2024-06-25 |